X-ray Topographic Investigations of Domain Structure in Czochralski Grown PrxLa1-xAlO3Crystals

Multiple-crystal x-ray topographic characterization of periodically domain-inverted KTiOPO4 crystal

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چکیده ندارد.

X-ray Topographic Investigation of Ferromagnetic Domain Structures with Closure Domain Configurations in Iron-silicon Single Crystals

The domain structure of single-crystal (110) plates of 2.4 wt % silicon-iron was investigated under tensile stress parallel to [IT01 by means of the Kerr technique and of Lang's method of transmission X-ray topography. It was possible, by using both section and traverse topographs, to gain information about the lattice distorsions, and therefore the domain structure, within specimens about 0,l ...

Impact of grown-in point-defects on the minority carrier lifetime in Czochralski-grown silicon wafers

In this study, we investigate the nature of some recombination active defects limiting the lifetime in Czochralski (CZ) silicon wafers, in the millisecond range. Due to their low concentrations, the observed defects are unlikely to be identified through Deep-Level Transient Spectroscopy (DLTS) or Electron Paramagnetic Resonance (EPR), hence we use lifetime spectroscopy combine with several anne...

X-ray structure of bacteriorhodopsin at 2.5 angstroms from microcrystals grown in lipidic cubic phases.

Lipidic cubic phases provide a continuous three-dimensional bilayer matrix that facilitates nucleation and growth of bacteriorhodopsin microcrystals. The crystals diffract x-rays isotropically to 2.0 angstroms. The structure of this light-driven proton pump was solved at a resolution of 2.5 angstroms by molecular replacement, using previous results from electron crystallographic studies as a mo...